发明名称 BONDING WIRE FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a Cu bonding wire having a Pd coating layer on the surface, being suitable for an on-vehicle device by improving the reliability of junction of a ball joint part in a high-temperature and high-humidity environment.SOLUTION: A bonding wire for semiconductor device comprising a Cu alloy core material and a Pd coating layer formed on the surface of the Cu alloy core material is characterized in that it includes at least one element selected from Sn, Sb, Bi and Se, and the concentration of the selected element or elements is 0.1 to 100 mass ppm in total, and Sn is ≤10 mass ppm, Sb is ≤10 mass ppm and Bi is ≤1 mass ppm.SELECTED DRAWING: None
申请公布号 JP2016225610(A) 申请公布日期 2016.12.28
申请号 JP20160096235 申请日期 2016.05.12
申请人 NIPPON MICROMETAL CORP;NIPPON STEEL SUMIKIN MATERIALS CO LTD 发明人 YAMADA TAKASHI;ODA TAIZO;SHINBARA TERUO;UNO TOMOHIRO
分类号 H01L21/60;C22C9/00;C22C9/02;C22C9/04;C22C9/06;C23C28/02 主分类号 H01L21/60
代理机构 代理人
主权项
地址