发明名称 METHOD FOR TEMPORARILY LOCKING A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE, MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE FOR CARRYING OUT THE METHOD, AND ASSEMBLY OF A MICROSTRUCTURE AND/OR ROUGHNESS MEASURING DEVICE AND A MEASUREMENT OBJECT
摘要 The invention relates to a method for temporarily locking a measuring device part, containing a measuring sensor, of a microstructure and/or roughness measuring device in a borehole of a measurement object that is delimited by a borehole wall (1). The invention also relates to a microstructure and/or roughness measuring device for carrying out the method according to the invention. The invention also relates to an assembly of a microstructure and/or roughness measuring device according to the invention and a measurement object having a borehole delimited by a borehole wall (1).
申请公布号 EP3108204(A1) 申请公布日期 2016.12.28
申请号 EP20160717541 申请日期 2016.03.10
申请人 Breitmeier Messtechnik GmbH 发明人 BREITMEIER, Ulrich
分类号 G01B11/30;G01B5/28;G01B21/30 主分类号 G01B11/30
代理机构 代理人
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