发明名称 INTEGRATED SETBACK READ WITH REDUCED SNAPBACK DISTURB
摘要 Embodiments of the present disclosure describe read and write operations in phase change memory to reduce snapback disturb. In an embodiment, an apparatus includes read circuitry to apply a read voltage to a phase change memory (PCM) cell, setback circuitry to apply a setback pulse to the PCM cell in response to the application of the read voltage, wherein the setback pulse is a shorter set pulse performed for a first period of time that is shorter than a second period of time for a regular set pulse that is configured to transition the PCM cell from an amorphous state to a crystalline state, sense circuitry to sense, concurrently with application of the setback pulse, whether the PCM cell is in the amorphous state or the crystalline state. Other embodiments may be described and/or claimed.
申请公布号 US2016372193(A1) 申请公布日期 2016.12.22
申请号 US201615180556 申请日期 2016.06.13
申请人 Intel Corporation 发明人 Kripanidhi Arjun;Pangal Kiran;Leem Lark-Hoon;Srinivasan Balaji
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. An apparatus comprising: read circuitry to apply a read voltage to a phase change memory (PCM) cell; setback circuitry to apply a setback pulse to the PCM cell in response to the application of the read voltage, wherein the setback pulse is a shorter set pulse performed for a first period of time that is shorter than a second period of time for a regular set pulse that is configured to transition the PCM cell from an amorphous state to a crystalline state; and sense circuitry to sense, concurrently with application of the setback pulse, whether the PCM cell is in the amorphous state or the crystalline state.
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