| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device that almost correctly extracts a contour of spherical foreign matters even when a material of an analyte or thickness thereof is not even, and luminance of a part of a foreign matter image on an X-ray fluoroscopic image is differently displayed.SOLUTION: After extracting a contour of a foreign matter on the basis of luminance information about pixels on an X-ray fluoroscopic image of an analyte, an X-ray inspection device is configured to: sample a plurality of points at a fixed interval on the contour; implement an operation obtaining a circle passing a prescribed number of consecutive three or more sampling points as shifting the sampling point one by one; obtain the number of times of passing in the vicinity of the sampling point other than points used in obtaining the circle as to the obtained circle; and determine the circle maximum in the number of times as a contour of a foreign matter image. Accordingly, even when the contour of the foreign image extracted by binarization and the like is in a state where a part of an analyte is missed arising from a structure of the analyte, a missing part is modified to enable an acquisition of more correct dimension information on the foreign matter.SELECTED DRAWING: Figure 2 |
