发明名称 METHOD FOR PROCESSING SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for processing a semiconductor wafer, capable of successfully subjecting a semiconductor wafer to processing that includes thinning and high-temperature processes, and a method for manufacturing a semiconductor device using the method.SOLUTION: A method for processing a semiconductor wafer includes the steps of: forming, on a semiconductor wafer, a film-like temporary fixation material comprising (A) a thermoplastic resin, (B) a (meth)acrylic monomer, and (C) a radical polymerization initiator generating radicals with radiation irradiation; irradiating the temporary fixation material formed on the semiconductor wafer with radiation; temporary fixing the semiconductor wafer and a support member via the temporary fixation material having been irradiated with radiation; subjecting the semiconductor wafer having been temporary fixed to the support member to processing; and separating the semiconductor wafer having been processed from the support member.SELECTED DRAWING: None
申请公布号 JP2016219512(A) 申请公布日期 2016.12.22
申请号 JP20150100361 申请日期 2015.05.15
申请人 HITACHI CHEMICAL CO LTD 发明人 SOBUE SHOGO;UENO KEIKO;TOKUYASU TAKAHIRO;MAKINO TATSUYA
分类号 H01L21/02;C09J4/02;C09J5/00;C09J7/00;C09J11/06;C09J201/00;H01L21/301 主分类号 H01L21/02
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