发明名称 SYMPTOM DIAGNOSIS SYSTEM, SYMPTOM DIAGNOSIS METHOD, AND SYMPTOM DIAGNOSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a symptom diagnosis system capable of properly predicting and diagnosing an inspection time of equipment.SOLUTION: A symptom diagnosis system 100 comprises: cluster set creation means (cluster set creation part 22) for creating a cluster set in which a feature amount is extracted from pieces of accumulation data of measurement values of inspection target equipment 10 and plural pieces of equipment 11 whose kinds are same to the kind of the target equipment; abnormality calculation means (abnormality calculation part 23) for calculating abnormality on the basis of the created cluster set and the measurement value of the target equipment; cluster selection means (cluster selection part 24) for selecting a cluster which is used for predicting the inspection time of the target equipment, from the cluster set, on the basis of the calculated abnormality; and inspection time prediction means (inspection time prediction part 25) for predicting the inspection time of the target equipment on the basis of the prediction value and a predetermined threshold, after calculating the prediction value of the equipment state of the target equipment on the basis of the selected cluster.SELECTED DRAWING: Figure 1
申请公布号 JP2016157206(A) 申请公布日期 2016.09.01
申请号 JP20150033346 申请日期 2015.02.23
申请人 HITACHI LTD 发明人 NASU SHINGO;IIBOSHI YOICHI;FURUYA SATORU
分类号 G05B23/02 主分类号 G05B23/02
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