发明名称 |
Semiconductor laser device |
摘要 |
A semiconductor laser device in an embodiment includes a compound semiconductor layer and a silicon layer. The compound semiconductor layer includes an active layer emitting laser light and has a first mesa structure. The silicon layer is bonded with the compound semiconductor layer. A diffraction grating is provided on a surface of the silicon layer which faces the compound semiconductor layer, and includes a main diffraction grating and two sub-diffraction gratings. The main diffraction grating extends in a longitudinal direction of the first mesa structure; the sub-diffraction gratings are disposed on both sides of the main diffraction grating. |
申请公布号 |
US9431793(B2) |
申请公布日期 |
2016.08.30 |
申请号 |
US201514625103 |
申请日期 |
2015.02.18 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Suzuki Nobuo;Tohyama Masaki |
分类号 |
H01S5/12;H01S5/10;H01S5/02;H01S5/026;H01S5/042;H01S5/065;H01S5/343;H01S5/22 |
主分类号 |
H01S5/12 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A semiconductor laser device comprising:
a compound semiconductor layer including an active layer emitting laser light, the compound semiconductor layer having a first mesa structure; and a silicon layer bonded with the compound semiconductor layer, a diffraction grating being provided on a surface of the silicon layer facing the compound semiconductor layer, the diffraction grating including a main diffraction grating and two sub-diffraction gratings, the main diffraction grating extending in a longitudinal direction of the first mesa structure, the sub-diffraction gratings being disposed on both sides of the main diffraction grating, wherein each of the main diffraction grating and the two sub-diffraction gratings is entirely disposed directly under the first mesa structure the main diffraction grating is disposed at a region containing a node of a first higher-order transverse mode of the laser light, each of the sub-diffraction gratings is disposed at a region containing a node of a second higher-order transverse mode of the laser light, and each of the sub-diffraction gratings is disposed with its period and phase substantially equal to those of the main diffraction grating. |
地址 |
Minato-ku JP |