发明名称 Vertical memory devices and methods of manufacturing the same
摘要 Nonvolatile memory devices include at least four cylindrical-shaped channel regions, which extend vertically from portions of a substrate located at respective vertices of at least one rhomboid when viewed in a vertical direction relative to a surface of the substrate. A charge storage layer (e.g., ONO layer) is provided on an outer sidewall of each of the cylindrical-shaped channel regions. In addition, to achieve a high degree of integration, a plurality of vertically-stacked gate electrodes are provided, which extend adjacent each of the cylindrical-shaped channel regions.
申请公布号 US9431414(B2) 申请公布日期 2016.08.30
申请号 US201414517025 申请日期 2014.10.17
申请人 Samsung Electronics Co., Ltd. 发明人 Jang Byong-Hyun;Yoo Dong-Chul;Hwang Ki-Hyun;Nam Phil-Ouk;Ahn Jae-Young
分类号 H01L27/115;H01L29/66;H01L29/792 主分类号 H01L27/115
代理机构 Myers Bigel & Sibley, P.A. 代理人 Myers Bigel & Sibley, P.A.
主权项 1. A nonvolatile memory device, comprising: at least four cylindrical-shaped channel regions extending vertically from portions of a substrate located at respective vertices of at least one rhomboid when viewed in a vertical direction relative to a surface of the substrate; a charge storage layer on an outer sidewall of each of said at least four cylindrical-shaped channel regions; a plurality of vertically-stacked gate electrodes extending adjacent each of said at least four cylindrical-shaped channel regions; and a plurality of bit lines extending over said at least four cylindrical-shaped channel regions, said plurality of bit lines including at least first, second and third bit lines electrically coupled to respective ones of said at least four cylindrical-shaped channel regions; and wherein the first, second and third bit lines extend parallel to each other and in a direction oblique relative to all sides of the at least one rhomboid when viewed in the vertical direction.
地址 KR