发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, the contact electrode extends in the inter-layer insulating layer toward the second semiconductor region. The metal silicide film is in contact with the second semiconductor region and the contact electrode. The metal silicide film includes a first part and a second part. The first part is provided between a bottom of the contact electrode and the second semiconductor region. The second part is provided on a surface of the second semiconductor region between the first part and the gate electrode. A bottom of the second part is located at a position shallower than a bottom the first part.
申请公布号 US2016268285(A1) 申请公布日期 2016.09.15
申请号 US201514821910 申请日期 2015.08.10
申请人 Kabushiki Kaisha Toshiba 发明人 OKAMOTO Hiroki;Itokawa Hiroshi;Kitamura Masayuki;Yagishita Atsushi
分类号 H01L27/115;H01L23/532;H01L21/768;H01L23/535 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer containing silicon, the semiconductor layer including a first semiconductor region having a first conductivity type and a second semiconductor region having a second conductivity type; a gate insulating film provided on the first semiconductor region; a gate electrode provided on the gate insulating film; an inter-layer insulating layer provided on the semiconductor layer and covering the gate electrode; a contact electrode extending in the inter-layer insulating layer toward the second semiconductor region; and a metal silicide film being in contact with the second semiconductor region and the contact electrode, the metal silicide film including a first part and a second part, the first part provided between a bottom of the contact electrode and the second semiconductor region, the second part provided on a surface of the second semiconductor region between the first part and the gate electrode, a bottom of the second part being located at a position shallower than a bottom the first part.
地址 Minato-ku JP