发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 According to one embodiment, a semiconductor memory device includes a stacked body and a column. The stacked body includes a plurality of electrode layers. The column includes a semiconductor channel, a charge storage film, and a doped silicon layer. The semiconductor channel extends in the stacking direction. The semiconductor channel is a polycrystalline. An average grain size of crystals in a polycrystalline is not less than a film thickness of the semiconductor channel. The charge storage film is provided between the semiconductor channel and the electrode layers. The doped silicon layer contains a metal element and an impurity other than a metal element. The doped silicon layer is in contact with a top end of the semiconductor channel.
申请公布号 US2016268274(A1) 申请公布日期 2016.09.15
申请号 US201615053338 申请日期 2016.02.25
申请人 Kabushiki Kaisha Toshiba 发明人 KAWAI Tomoya;Fukuzumi Yoshiaki;Aochi Hideaki
分类号 H01L27/115;H01L27/105 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a stacked body including a plurality of electrode layers, an insulator being interposed between the electrode layers; and a column extending in a stacking direction in the stacked body; the column including a semiconductor channel extending in the stacking direction, the semiconductor channel being a polycrystalline, an average grain size of crystals in the polycrystalline being not less than a film thickness of the semiconductor channel, a charge storage film provided between the semiconductor channel and the electrode layers, and a doped silicon layer containing a metal element and an impurity other than a metal element, the doped silicon layer being in contact with a top end of the semiconductor channel.
地址 Minato-ku JP