发明名称 Security system and methods for integrated devices
摘要 Systems and methods for implementing security mechanisms in integrated devices and related structures. This method can include validating a device ID, generating a random value based on selected seed parameters, performing logic operations from hardware using the random value, and validating the integrated device based on logic operations from software using the random value. The system can include executable instructions for performing the method in a computing system. Various embodiments of the present invention represent several implementations of a security mechanism for integrated devices. These implementations provide several levels of encryption or protection of integrated devices, which can be tailored depending on the hardware and/or software requirements of specific applications.
申请公布号 US9418247(B2) 申请公布日期 2016.08.16
申请号 US201313762237 申请日期 2013.02.07
申请人 MCUBE INC. 发明人 Bhandari Sanjay;Maraldo Tony
分类号 G06F21/00;G06F21/73 主分类号 G06F21/00
代理机构 Kilpatrick Townsend & Stockton LLP 代理人 Kilpatrick Townsend & Stockton LLP
主权项 1. A method for implementing a security mechanism in an integrated MEMS (Micro-Electro-Mechanical-Systems) device including, the integrated MEMS device configured with a MEMS sensor, a MEMS test module, and an internal pattern generator, the integrated MEMS device being further configured with an output register associated with a corresponding sensing operation, wherein, in a test mode, the output register is configured to receive a value from the internal pattern generator or internal logic, the integrated MEMS device being electrically coupled to a computing system programmed to perform the method, the method comprising: reading, by a processor disposed within the computing system, a device ID from a device ID register disposed within the integrated MEMS device; determining, by the processor, whether the device ID of the integrated MEMS device is valid; determining, by the processor, a random value, wherein determining the random value includes enabling, by the MEMS test module a MEMS process to determine the random value or by setting a value associated with a duty cycle of the internal pattern generator in the output register and then reading from the output register to obtain the value from the internal pattern generator; writing, by the processor, the random value to a security register disposed within the integrated device; determining, by the processor, a configuration value; writing, by the processor, the configuration value to a security configuration register disposed within the integrated device; determining, by a logic module disposed within the integrated device, an operation result via a logic operation using the random value and the configuration value; writing the operation result to the security register; determining, by the processor, a validation result using the logic operation; reading, by the processor, the operation result from the security register; and determining, by the processor, whether the integrated MEMS device is valid using the device ID, the validation result, and the operation result.
地址 San Jose CA US