| 摘要 |
The present invention provides a test device and a test method, capable of avoiding generation of a phase lag between actual signals, removing only a disturbance signal even when the frequency component of a measured waveform overlaps with the frequency of a disturbance, preventing measurement results from being affected and performing an accurate test. Measurement data are obtained by specifying a position of the disturbance data of disturbance measurement data stored in a disturbance measurement data storage unit (110) through a matched filter (120) on the basis of the disturbance measurement data and test measurement data stored in a test measurement data storage unit (112) to remove the disturbance data from the test measurement data. |
