| 摘要 |
Test system and method comprise a controller, which can be microprocessor derived and include operating system for programmability, to control low voltage signals and feedback for managing the test system. High potential test system can include an amplifier comprising solid-state and/or passive components amplifying lower voltage signal to produce higher voltage output signal based on signal monitoring and control provided by controller. Controlled higher voltage output signal can be injected into high voltage multiplier circuit resulting in high DC voltage output voltage up to 50 kV or higher range. The monitoring can include feedback indicative of higher voltage signal output of amplifier and/or high DC voltage output voltage of high voltage multiplier circuit. System feedback and control can be fully automated, or selectively user-controlled via a user interface providing continuous and/or selective monitoring and display of system parameters and measured signal inputs and/or outputs. |
