发明名称 METHOD FOR MANUFACTURING BONDED WAFER
摘要 A method for manufacturing a bonded wafer, includes: ion-implanting a gas ion such as a hydrogen ion from a surface of a bond wafer, thereby forming an ion-implanted layer; bonding the bond wafer and a base wafer; producing a bonded wafer having a thin-film on the base wafer by delaminating the bond wafer along the ion-implanted layer; and performing an RTA treatment on the bonded wafer in a hydrogen gas-containing atmosphere; wherein a protective film is formed onto the surface of the thin-film in a heat treatment furnace in the course of temperature-falling from the maximum temperature of the RTA treatment before the bonded wafer is taken out from the heat treatment furnace; and then the bonded wafer with the protective film being formed thereon is taken out from the heat treatment furnace, and is then cleaned with a cleaning liquid which can etch the protective film and the thin-film.
申请公布号 US2016365273(A1) 申请公布日期 2016.12.15
申请号 US201515120905 申请日期 2015.02.12
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 KOBAYASHI Norihiro;AGA Hiroji
分类号 H01L21/762;H01L21/02;H01L21/324;H01L21/265 主分类号 H01L21/762
代理机构 代理人
主权项
地址 Tokyo JP