发明名称 X-RAY CT DEVICE AND SEQUENTIAL CORRECTION PARAMETER DETERMINATION METHOD
摘要 According to the present invention, both high image quality and low radiation exposure are achieved, without increasing the number of steps or the amount of data that is held. A table of sequential correction parameters optimized under imaging conditions that are typical (hereinafter termed "typical imaging conditions") is held, and sequential correction parameters that have been optimized under actual imaging conditions are determined, from among the sequential correction parameters held in the table. Weights serving as standards are held together with the parameter table, and the standard weights are also reflected during generation of sequential correction parameters for each pixel location.
申请公布号 WO2016199716(A1) 申请公布日期 2016.12.15
申请号 WO2016JP66753 申请日期 2016.06.06
申请人 HITACHI, LTD. 发明人 YAMAKAWA, Keisuke;KOJIMA, Shinichi
分类号 A61B6/03 主分类号 A61B6/03
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