发明名称 ANTI-REFLECTIVE IMAGING LAYER FOR MULTIPLE PATTERNING PROCESS
摘要 Novel methods of double patterning a photosensitive resin composition are provided. The methods involve applying the photosensitive composition to a substrate and thermally crosslinking the composition. The crosslinked layer can be used to provide reflection control. Upon exposure to light, the crosslinked polymer (or oligomer or monomer) in the compositions will decrosslink, rendering the light-exposed portions soluble in typical photoresist developing solutions (e.g., alkaline developers). Advantageously, the crosslinked portions of the composition remain insoluble in the solvent used to form the photosensitive composition. As a result, the coating, lithographic, and or developing steps can be repeated multiple times in varying order, depending upon the particular process, without destroying earlier-formed patterns.
申请公布号 EP2070107(B1) 申请公布日期 2016.12.14
申请号 EP20070814157 申请日期 2007.08.16
申请人 Brewer Science, Inc. 发明人 GUERRERO, Douglas J.;MERCADO, Ramil-Marcelo
分类号 G03F7/00 主分类号 G03F7/00
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