首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Method for Measuring Thickness of Layer in Image Sensor and Pattern Therefor
摘要
申请公布号
KR100853788(B1)
申请公布日期
2008.08.25
申请号
KR20060117374
申请日期
2006.11.27
申请人
发明人
分类号
H01L27/146;H01L21/66
主分类号
H01L27/146
代理机构
代理人
主权项
地址
您可能感兴趣的专利
beta , gamma -dihydropolyprenyl alcohol derivatives and pharmaceutical composition containing a polyprenyl compound
Hydrodesulfurizing catalyst composition and method of preparing same
Multiple input/output devices having shared address space
No-owner frame and multiple token removal mechanism for token ring networks
Curable phosphazene compositions and coated articles
Light valve incorporating a suspension stabilized with a block polymer
Dihalogenobenzene derivatives
Food preparation and delivery apparatus
Tire compactor and method
Ballistic optimizing system for rifles
Reinforced alumina ceramic-metal bodies
Hair removal device
Grouping of cylinders in the drying section of a paper machine
Fluid-based acceleration and tilt sensor
Method of making a beam for a decorative suspended ceiling
Device for iontophoretic non-invasive sampling or delivery of substances
Centrifuge rotor having a predetermined region of failure
Dispensing closure with twist collar
Control system for an internal combustion engine and/or motor vehicle
Process and apparatus for the pyrolysis of carbonaceous material
