| 摘要 |
This application discloses an automatic lighting method for optical inspection and the optical inspection machine table thereof. Automatic regulation of light source is performed among different kinds of circuit boards to be tested. The intensity of illuminated light is adjusted by setting each dimming region on the circuit boards to be tested and its corresponding types, and comparison data between captured image data corresponding to at least one dimming region of each illumination configuration and preloaded luminosity threshold standard value of dimming region of selected type. Then, corresponding illumination degree of difference is acquired in accordance with illumination value of image data between any two types of dimming region captured under the configuration of synchronous exposure of lateral light and forward light for selecting new adjusting configuration of light. Accordingly, this application can perform automatic optimization of illumination light source configuration so that circuit boards to be tested is able to be tested in uniformed condition. |
