发明名称 PHOTOSENSITIVE POLYSILAZANE COMPOSITION AND FORMING METHOD OF PATTERNED POLYSILAZANE FILM
摘要 PROBLEM TO BE SOLVED: To obtain a photosensitive polysilazane composition which can form a film, especially which enables micropatterning process with light and which can be used as a positive resist by incorporating polysilazane and a photoacid producing agent. SOLUTION: This photosensitive polysilazane composition contains polysilazane and a photoacid producing agent. Namely, by adding a photoacid producing agent to polysilazane and then irradiating the polysilazane with light according to a pattern, the polysilazane is decomposed, and a patterned polysilazane film can be obtained by successive developing. The patterned polysilazane film can be directly used as a photoresist. This photoresist is a positive type and has high resolution and higher resistance against oxygen plasma compared to an organic resist. Especially, since the polysilazane film has high resistance against oxygen plasma, it can be used as an alternative material for a silicon-containing resist in a two-layer resist method.
申请公布号 JP2000181069(A) 申请公布日期 2000.06.30
申请号 JP19990283106 申请日期 1999.10.04
申请人 TONEN CORP 发明人 NAGAHARA TATSURO;MATSUO HIDEKI;AOKI TOMOKO;YAMADA KAZUHIRO
分类号 H01L21/027;C08K5/14;C08L83/16;G03F7/004;G03F7/039;G03F7/075;H01L21/312 主分类号 H01L21/027
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