发明名称 静電容量測定システム及び静電容量測定方法ならびにキャパシタセルの劣化状態推定システム及び劣化状態推定方法
摘要 PROBLEM TO BE SOLVED: To accurately measure the effective electrostatic capacitance of a capacitor cell even when the electrostatic capacitance of the capacitor cell is measured at a given voltage.SOLUTION: A system includes voltage measurement means for detecting cell voltages of a plurality of capacitor cells C1 to Cn, voltage adjustment means for decreasing or increasing the voltages of the capacitors C1 to Cn, and an arithmetic operation device 16 for controlling the voltage measurement means. The arithmetic operation device 16 determines, based on the cell voltages of the capacitor cells C1 to Cn measured by the voltage measurement means, a measurement start voltage and a measurement end voltage, measures voltage measurement time for dropping of the cell voltages of the capacitor cells C1 to Cn from the measurement start voltage to the measurement end voltage, calculates the electrostatic capacitances of the capacitor cells C1 to Cn on the basis of the voltage measurement time, and corrects the electrostatic capacitances by correction values according to the capacitor cells C1 to Cn to calculate effective electrostatic capacitances.
申请公布号 JP6041528(B2) 申请公布日期 2016.12.07
申请号 JP20120114673 申请日期 2012.05.18
申请人 JMエナジー株式会社 发明人 大島 智弘
分类号 G01R27/26;G01R35/00;H01G13/00 主分类号 G01R27/26
代理机构 代理人
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