发明名称 EUVマイクロリソグラフィ用の照明光学系、この種の照明光学系用のEUV減衰器、及びこの種の照明光学系を有する照明系及び投影露光装置
摘要 An illumination optical system for EUV microlithography is used to direct an illumination light beam from a radiation source to an object field. At least one EUV mirror has a reflective face with a nonplanar mirror topography for forming the illumination light beam. The EUV mirror has at least one EUV attenuator arranged in front of it. The attenuator face which faces the reflective face of the EUV mirror has an attenuator topography which is designed to complement the mirror topography such that at least sections of the attenuator face are arranged at a constant interval from the reflective face. The result is an illumination optical system in which it is possible to correct unwanted variations in illumination parameters, for example an illumination intensity distribution or an illumination angle distribution, over the object field with as few unwanted radiation losses as possible.
申请公布号 JP6041304(B2) 申请公布日期 2016.12.07
申请号 JP20120501137 申请日期 2009.03.27
申请人 カール・ツァイス・エスエムティー・ゲーエムベーハー 发明人 シュミット ニコラス;ハーティエス ヨアキム;ビンゲル ウルリッヒ;プニニ ボアツ
分类号 H01L21/027;G02B5/10;G02B7/182;G02B19/00 主分类号 H01L21/027
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