Preparation of specimen arrays on an EM grid

摘要

The invention provides methods and compositions for preparation of complex specimen arrays for analysis by electron microscopy. These methods and compositions can permit high throughput screening of samples on single EM grid supports using sample volumes in the nanoliter and picoliter range.

主权项

1. A method for preparing an electron microscopy sample on an EM sample grid, comprising:
discretely dispensing a plurality of specimens onto an EM sample grid to thereby provide an ordered array of discrete specimen locations, each specimen of the plurality of specimens being placed into an individual specimen location in the array of locations, and each individual specimen location in the array of locations having an area of between about 2000 μm2 to about 70,000 μm2; and discretely applying a volume of a stain material suitable for contrast enhancement in an electron microscope to each individual specimen location in the array of locations that received a specimen.