发明名称 |
Nonvolatile memory device and method of setting a reference current in a nonvolatile memory device |
摘要 |
A nonvolatile memory device comprises a cell array including a memory cell. The nonvolatile memory device also includes a reference signal generator configured to generate a reference current for reading data stored in the memory cell. The reference signal generator includes a first circuit coupled to a current summation node and having a reference cell. The first circuit is configured to generate a first current that flows between drain and source terminals of a transistor in the reference cell. The reference signal generator also includes a second circuit coupled to the current summation node and configured to generate a second current that is a temperature-dependent current. The current summation node is configured to combine the first and second currents to generate the reference current that tracks a temperature trend of a current flowing through the memory cell. |
申请公布号 |
US9595340(B2) |
申请公布日期 |
2017.03.14 |
申请号 |
US201514600102 |
申请日期 |
2015.01.20 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Chen Hsu-Shun;Li Gu-Huan;Kuo Cheng-Hsiung;Chih Yue-Der |
分类号 |
G11C16/04;G11C16/28;G11C16/30;G11C7/04;G11C7/06;G11C7/14 |
主分类号 |
G11C16/04 |
代理机构 |
Jones Day |
代理人 |
Jones Day |
主权项 |
1. A nonvolatile memory device comprising:
a cell array including a memory cell; and a reference signal generator configured to generate a reference current for reading data stored in the memory cell, the reference signal generator comprising: a first circuit coupled to a current summation node and including a reference cell, the reference cell having a floating gate and a control gate, wherein the first circuit is configured to generate a first current that flows between drain and source terminals of a transistor in the reference cell, a second circuit coupled to the current summation node and configured to generate a second current that is a temperature-dependent current, and the current summation node configured to combine the first and second currents to generate the reference current that tracks a temperature trend of a current flowing through the memory cell. |
地址 |
Hsinchu TW |