发明名称 Crossed nanobeam structure for a low-threshold germanium laser
摘要 A crossed nanobeam structure for strain engineering in semiconductor devices is provided. For example, such a structure can be used for a low-threshold germanium laser. While the photonic crystal nanobeam enables light confinement in a subwavelength volume with small optical loss, another crossing nanobeam induces high tensile strain in the small region where the optical mode is tightly confined. As maintaining a small optical loss and a high tensile strain reduces the required pumping for achieving net optical gain beyond cavity losses, this technique can be used to develop an extremely low-threshold Ge laser source. Moreover, the structure can be easily integrated into electronic and photonic circuits.
申请公布号 US9595812(B2) 申请公布日期 2017.03.14
申请号 US201514747756 申请日期 2015.06.23
申请人 The Board of Trustees of the Leland Stanford Junior University 发明人 Nam Donguk;Petykiewicz Jan A.;Sukhdeo Devanand S.;Gupta Shashank;Vuckovic Jelena;Saraswat Krishna C.
分类号 H01S5/32;H01S5/06;H01S5/026;H01S5/10 主分类号 H01S5/32
代理机构 Lumen Patent Firm 代理人 Lumen Patent Firm
主权项 1. A semiconductor structure comprising: a semiconductor member configured as a first beam having an active region sandwiched between two side regions along its length; and two stress members affixed to opposite lateral surfaces of the active region; wherein the stress members are configured to provide mechanical stress to the active region, whereby the active region as a whole is subject to mechanical strain; wherein the stress members are configured to form a second beam perpendicular to the first beam.
地址 Palo Alto CA US