发明名称 |
Crossed nanobeam structure for a low-threshold germanium laser |
摘要 |
A crossed nanobeam structure for strain engineering in semiconductor devices is provided. For example, such a structure can be used for a low-threshold germanium laser. While the photonic crystal nanobeam enables light confinement in a subwavelength volume with small optical loss, another crossing nanobeam induces high tensile strain in the small region where the optical mode is tightly confined. As maintaining a small optical loss and a high tensile strain reduces the required pumping for achieving net optical gain beyond cavity losses, this technique can be used to develop an extremely low-threshold Ge laser source. Moreover, the structure can be easily integrated into electronic and photonic circuits. |
申请公布号 |
US9595812(B2) |
申请公布日期 |
2017.03.14 |
申请号 |
US201514747756 |
申请日期 |
2015.06.23 |
申请人 |
The Board of Trustees of the Leland Stanford Junior University |
发明人 |
Nam Donguk;Petykiewicz Jan A.;Sukhdeo Devanand S.;Gupta Shashank;Vuckovic Jelena;Saraswat Krishna C. |
分类号 |
H01S5/32;H01S5/06;H01S5/026;H01S5/10 |
主分类号 |
H01S5/32 |
代理机构 |
Lumen Patent Firm |
代理人 |
Lumen Patent Firm |
主权项 |
1. A semiconductor structure comprising:
a semiconductor member configured as a first beam having an active region sandwiched between two side regions along its length; and two stress members affixed to opposite lateral surfaces of the active region; wherein the stress members are configured to provide mechanical stress to the active region, whereby the active region as a whole is subject to mechanical strain; wherein the stress members are configured to form a second beam perpendicular to the first beam. |
地址 |
Palo Alto CA US |