发明名称 Transistor with performance boost by epitaxial layer
摘要 The present disclosure relates to a transistor device. In some embodiments, the transistor device has an epitaxial layer disposed over a substrate. The epitaxial layer is arranged between a source region and a drain region separated along a first direction. Isolation structures are arranged on opposite sides of the epitaxial layer along a second direction, perpendicular to the first direction. A gate dielectric layer is disposed over the epitaxial layer, and a conductive gate electrode is disposed over the gate dielectric layer. The epitaxial layer overlying the substrate improves the surface roughness of the substrate, thereby improving transistor device performance.
申请公布号 US9595589(B2) 申请公布日期 2017.03.14
申请号 US201514980553 申请日期 2015.12.28
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Cheng Yu-Hung;Wu Cheng-Ta;Tu Yeur-Luen;Tsai Chia-Shiung;Lee Ru-Liang;Lin Tung-I;Chen Wei-Li
分类号 H01L29/167;H01L29/207;H01L29/227;H01L31/0288;H01L29/423;H01L29/66;H01L21/02;H01L29/10;H01L27/146;H01L29/06;H01L29/16;H01L29/165 主分类号 H01L29/167
代理机构 Eschweiler & Associates, LLC 代理人 Eschweiler & Associates, LLC
主权项 1. A transistor device, comprising: an epitaxial layer disposed over a substrate between a source region and a drain region separated along a first direction; isolation structures extending into the substrate on opposite sides of the epitaxial layer along a second direction, perpendicular to the first direction; a gate dielectric layer disposed over the epitaxial layer, wherein the gate dielectric layer comprises a non-planar layer that curves towards the substrate along outer edges of the gate dielectric layer; and a conductive gate electrode disposed over the gate dielectric layer.
地址 Hsin-Chu TW