| 发明名称 | Hardware apparatuses and methods to check data storage devices for transient faults | ||
| 摘要 | Methods and apparatuses relating to a hardware memory test unit to check a section of a data storage device for a transient fault before the data is stored in and/or loaded from the section of the data storage device are described. In one embodiment, an integrated circuit includes a hardware processor to operate on data in a section of a data storage device, and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor. | ||
| 申请公布号 | US9595349(B2) | 申请公布日期 | 2017.03.14 |
| 申请号 | US201514751113 | 申请日期 | 2015.06.25 |
| 申请人 | Intel Corporation | 发明人 | Raj Ashok;Gabor Ron;Shafi Hisham;Kumar Mohan J.;Yigzaw Theodros |
| 分类号 | G11C29/00;G11C29/04;G11C13/00 | 主分类号 | G11C29/00 |
| 代理机构 | Nicholson De Vos Webster & Elliot, LLP | 代理人 | Nicholson De Vos Webster & Elliot, LLP |
| 主权项 | 1. An integrated circuit comprising: a hardware processor to operate on data in a section of a data storage device; and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor. | ||
| 地址 | Santa Clara CA US | ||