发明名称 NEAR INFRARED SPECTRAL ANALYZING DEVICE
摘要 <p>PURPOSE: To attain a prescribed analyzing precision without spending an excessive time by setting a proper measuring frequency. CONSTITUTION: A sample is put into the sample vessel of a sample part 3, the light emitted from a light source 7 is made into a parallel beam in a spectroscope 2, and this parallel beam is periodically interrupted by the rotation of a chopper wheel 9 and then passed through a slit 10 to form a monochromatic light with high purity. This monochromatic light is emitted to the projecting surface of the sample part 3, and the diffused reflected light from the sample is converged by a converging concave mirror 15, further converged by a converging convex mirror 13, and projected to a photoelectric sensor 14. The diffused reflected light received by the photoelectric sensor 14 is amplified by an amplifier 16, and converted into a digital signal by an A/D converter 17 to calculate the component concentration of the measured sample by a CPU 18. In the CPU 18, a standard measuring frequency necessary for the attainment of a prescribed concentration analyzing precision is set every component of various samples, and the maximum measuring frequency necessary for analysis is set from the designated sample. its components and their standard measuring frequencies to determine the measuring frequency.</p>
申请公布号 JPH08320290(A) 申请公布日期 1996.12.03
申请号 JP19950149459 申请日期 1995.05.24
申请人 ISEKI & CO LTD 发明人 FUJIOKA SADAKAZU;MORI TAIICHI
分类号 G01N21/35;G01N21/3554;G01N21/3563;G01N21/359;(IPC1-7):G01N21/35 主分类号 G01N21/35
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