发明名称 Field Strength Monitoring for Optimal Performance
摘要 Disclosed are various embodiments for field strength monitoring of electromagnetic fields generated by a guided surface waveguide probe. A field meter measures the field strength of the electromagnetic field. The field meter communicates the measured field strength to a probe control system coupled to the guided surface waveguide probe. Adjustments can be made to one or more operational parameters of the guided surface waveguide probe according to the measured field strength.
申请公布号 US2017067951(A1) 申请公布日期 2017.03.09
申请号 US201514847599 申请日期 2015.09.08
申请人 CPG Technologies, LLC 发明人 Corum James F.;Corum Kenneth L.;Lilly James D.;Pinzone Joseph F.
分类号 G01R29/12;G01R27/32;H01P3/00 主分类号 G01R29/12
代理机构 代理人
主权项 1. A system, comprising: a probe control system coupled to a guided surface waveguide probe, the probe control system configured to adjust one or more operational parameters of the guided surface waveguide probe; and a plurality of field meters in data communication with the probe control system, the plurality of field meters configured to: measure field strength associated with an electromagnetic field generated by the guided surface waveguide probe; andcommunicate field strength information to the probe control system, the field strength information including the measured field strength.
地址 Newbury OH US