发明名称 SYSTEMS AND METHODS FOR WAVE FUNCTION BASED ADDITIVE MANUFACTURING
摘要 A system configured to facilitate formation of additive manufacturing objects is described. The system may obtain a virtual three-dimensional representation of an object, determine positions for a layered series of contour lines for the object based on the three-dimensional representation; and determine individual wave functions that correspond to a given contour line for a given layer. An individual wave function may indicate a three or more dimensional waveform pathway for an additive manufacturing platform to follow within a given layer when forming the given layer of the object. The system may control movement of the additive manufacturing platform to additively manufacture the object following waveform pathways. Controlling movement of the additive manufacturing platform based on the wave functions facilitates additively manufacturing objects without a need for support material for overhanging features. The present system is controlled to additively manufactured objects having a knit, weave, and/or other fabric-like texture.
申请公布号 US2017066196(A1) 申请公布日期 2017.03.09
申请号 US201615257819 申请日期 2016.09.06
申请人 FEETZ, INC. 发明人 Beard Nigel;Edmondson Walter;Phillips John William;Bitonti Francis Anthony;Beard Lucy
分类号 B29C67/00;B29D35/02;B33Y50/02;B33Y10/00;B33Y30/00 主分类号 B29C67/00
代理机构 代理人
主权项 1. An additive manufacturing system configured to facilitate formation of additive manufacturing objects, the system comprising: an additive manufacturing platform configured to move in three or more dimensions to process additive manufacturing material to form an object; and one or more hardware processors configured by machine-readable instructions to: obtain a virtual three-dimensional representation of the object, the virtual three-dimensional representation conveying one or more physical properties of the object;determine positions for a layered series of contour lines for the object based on the three-dimensional representation, the layered series of contour lines corresponding to cross-sectional shapes of the object in different two-dimensional layers of the object;determine individual wave functions based on the contour lines and the one or more physical properties of the object, an individual wave function corresponding to a given contour line for a given layer, an individual wave function indicating a three or more dimensional waveform pathway for the additive manufacturing platform to follow within a given layer when printing the given layer of the object; andcontrol movement of the additive manufacturing platform and processing of the additive manufacturing material to additively manufacture the object following waveform pathways based on the wave functions determined for the different two-dimensional layers.
地址 Chattanooga TN US