发明名称 |
DETECTION ASSEMBLY, SYSTEM AND METHOD |
摘要 |
An electron detector assembly configured for detecting electrons emitted from a sample irradiated by an electron beam, comprising a scintillator including a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon, a light guide plate coupled to the scintillator layer and comprising a peripheral surface, and a single or plurality of silicon photomultiplier devices positioned upon the peripheral surface and arranged perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from an electron impinging upon the scintillator layer. |
申请公布号 |
US2017069459(A1) |
申请公布日期 |
2017.03.09 |
申请号 |
US201615253905 |
申请日期 |
2016.09.01 |
申请人 |
EL-MUL TECHNOLOGIES LTD. |
发明人 |
CHEIFETZ ELI;WEINGARTEN AMIT;SHOFMAN SEMYON;REINHORN SILVIU |
分类号 |
H01J37/244;H01J37/285 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
1. An electron detector assembly configured for detecting electrons emitted from a sample irradiated by an electron beam, comprising:
a scintillator comprising a scintillator layer, the scintillator layer emitting light signals corresponding to impingement of electrons thereupon; a light guide plate coupled to the scintillator layer and comprising a peripheral surface; and a single or plurality of silicon photomultiplier devices positioned upon the peripheral surface and arranged perpendicularly or obliquely relative to the scintillating surface, the silicon photomultiplier device being configured to yield an electrical signal from an electron impinging upon the scintillator layer. |
地址 |
REHOVOT IL |