发明名称 |
METHOD FOR FORMING SEMICONDUCTOR STRUCTURE WITH NANOWIRE STRUCTURES |
摘要 |
The present invention provides a method for forming a semiconductor structure. Firstly, a substrate is provided, the substrate comprises an insulating layer and at least one first nano channel structure disposed thereon, a first region and a second region being defined on the substrate, next, a hard mask is formed within the first region, afterwards, an etching process is performed, to remove parts of the insulating layer within the second region, an epitaxial process is then performed, to form an epitaxial layer on the first nano channel structure, and an anneal process is performed, to transform the first nano channel structure and the epitaxial layer into a first nanowire structure, wherein the diameter of the first nanowire structure within the first region is different from the diameter of the first nanowire structure within the second region. |
申请公布号 |
US2017069540(A1) |
申请公布日期 |
2017.03.09 |
申请号 |
US201615356671 |
申请日期 |
2016.11.21 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Liou En-Chiuan;Tung Yu-Cheng;Yang Chih-Wei |
分类号 |
H01L21/8234;H01L21/02;H01L29/10;H01L27/088;H01L29/08;H01L29/06;H01L21/324 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming a semiconductor structure, comprising:
providing a substrate, the substrate comprising an insulating layer and at least one first nano channel structure disposed thereon, a first region and a second region being defined on the substrate; forming a hard mask within the first region, to cover the first nano channel structure and the insulating layer; performing an etching process, to remove parts of the insulating layer within the second region; performing an epitaxial process, to form an epitaxial layer on the first nano channel structure, wherein the thickness of the epitaxial layer within the first region is different from the thickness of the epitaxial layer within the second region; and performing an anneal process, to transform the first nano channel structure and the epitaxial layer into a first nanowire structure, wherein the diameter of the first nanowire structure within the first region is different from the diameter of the first nanowire structure within the second region. |
地址 |
Hsin-Chu City TW |