REFLECTION CHARACTERISTIC MEASURING SYSTEM

摘要

In order to perform a measurement while flexibly changing the direction of lighting and the wavelength with a simple structure, a reflection characteristic measuring system (1) according to the present invention is provided with: a display device (2) having a flat display screen (4) and capable of flexibly changing a lighting position; and a detection device (3) to be placed on the display screen (4) of the display device (2). The detection device (3) is provided with: a domed reflecting mirror (17) provided with an inner reflecting surface (17b) and an opening part (17a) passing through the reflecting surface (17b), the inner reflecting surface (17b) being placed at such a position as to cover at least a portion of the display screen (4) of the display device (2), and arranged to reflect light emitted from the lighting position of the display screen (4) so as to focus the light on a predetermined position; and a detection unit (18) that detects light reflected from an object (X) to be measured placed at the predetermined position and emitted out of the reflecting mirror (17) through the opening part (17a) of the reflecting mirror (17).