SYSTEM AND METHOD USING OAM SPECTROSCOPY LEVERAGING FRACTIONAL ORBITAL ANGULAR MOMENTUM AS SIGNATURE TO DETECT MATERIALS

摘要

An apparatus detects a material within a sample and includes signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first beam to the sample. The orbital angular momentum imparts a phase factor of exp(imφ), where m is at least one of an integer value or fractional value and φ is the azimuth angle, to the first light beam. A detector receives the first light beam after the first light beam passes through the sample and detects the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.

主权项

1. An apparatus that detects a material within a sample, comprising:
signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first beam to the sample, the orbital angular momentum imparting a phase factor of exp(imφ), where m is at least one of an integer value or fractional value and φ is the azimuth angle, to the first light beam; a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.