发明名称 IMAGE RECORDING APPARATUS AND METHOD OF DETECTING DEFECTIVE RECORDING ELEMENT
摘要 Provided are an image recording apparatus that efficiently detects defective recording elements causing image defects in a plurality of recording heads and a method of detecting the defective recording elements. An image recording apparatus including: a plurality of recording heads; an indicator acquisition unit for acquiring an indicator which relatively indicates how easily image defects are visually perceived for each color, an appearance ratio setting unit for setting an appearance ratio of a test pattern as a higher value as the indicator of each color becomes higher; a recording unit for recording the test pattern of each color on a recording medium at the appearance ratio; an imaging unit for capturing an image of the test pattern which is recorded on the recording medium; and an analysis unit for analyzing the captured test pattern and detecting a defect of a recording element in the recording head.
申请公布号 US2017066268(A1) 申请公布日期 2017.03.09
申请号 US201615354203 申请日期 2016.11.17
申请人 FUJIFILM Corporation 发明人 KYOSO Tadashi;YAMANOBE Jun;SUMI Katsuto
分类号 B41J29/393;B41J2/21 主分类号 B41J29/393
代理机构 代理人
主权项 1. An image recording apparatus comprising: a plurality of recording heads that respectively eject inks with different colors from recording elements; an indicator acquisition unit for acquiring an indicator which relatively indicates how easily image defects are visually perceived for each color; an appearance ratio setting unit for setting an appearance ratio of a test pattern as a higher value as the indicator of each color becomes higher; a recording unit for recording the test pattern of each color on a recording medium at the appearance ratio through the plurality of recording heads; an imaging unit for capturing an image of the test pattern which is recorded on the recording medium; and an analysis unit for analyzing the captured test pattern and detecting a defective recording element in the recording head that has recorded the test pattern.
地址 Tokyo JP