| 摘要 |
A calibration device for a calibration procedure in particular for at least one of the following is proposed: two-photon imaging, multi-photon imaging, two-photon microscopy, multi-photon microscopy, second-harmonic generation imaging, third harmonic generation imaging, coherent anti-Stokes Raman scattering (CARS), coherent Stokes Raman scattering (CSRS), stimulated Raman scattering (SRS), two-color two-photon absorption imaging, two-color two- photon fluorescence imaging or any other non-linear light induced effect. The calibration device (10) comprises at least one detector (32) and at least one holder (30) for holding the at least one detector (32).The at least one detector (32) is a semi-conductor device having an extended light-sensitive detection area (36),preferably comprising a semiconductor material. The extended light-sensitive detection area (36) is larger than 1 mm in a first direction and larger than 1 mm in a second direction, the second direction being perpendicular to the first direction. The extended light-sensitive detection area is adapted such that the two-photon, multi-photon, second-harmonic generation, third harmonic generation or any other non-linear excitation effect is excited and/or induced therein and wherein the excited and/or induced effect is detected therewith.A calibration method using the calibration device (10) is also subject of the invention. |
