发明名称 TOP PINNED SOT-MRAM ARCHITECTURE WITH IN-STACK SELECTOR
摘要 Embodiments of the present disclosure generally relate to data storage and computer memory systems, and more particularly, to a SOT-MRAM cell and chip architecture. The SOT-MRAM chip architecture includes a memory cell array having a plurality of first leads, a plurality of second leads, and a plurality of memory cells. Each memory cell of the plurality of memory cells includes a MTJ and a selector element. These SOT-MRAM cells eliminate the need to pass large currents through the barrier layer of the MTJ and the selector element eliminates the large transistors usually required for selecting a single memory cell without disturbing neighboring memory cells.
申请公布号 US2017117027(A1) 申请公布日期 2017.04.27
申请号 US201514919247 申请日期 2015.10.21
申请人 HGST Netherlands B.V. 发明人 BRAGANCA Patrick M.;WAN Lei
分类号 G11C11/16;H01L43/02;H01L43/08;H01L27/22 主分类号 G11C11/16
代理机构 代理人
主权项 1. A memory cell, comprising: a magnetic tunnel junction; and a selector element disposed on the magnetic tunnel junction.
地址 Amsterdam NL