TEST METHOD OF VOLATILE MEMORY DEVICE EMBEDDED IN ELECTRONIC DEVICE

摘要

A method of operation of an electronic device comprising a storage device in which a volatile memory device and a non-volatile memory device are embedded include initializing a memory controller connected to the volatile memory device, via a host connected to the storage device; obtaining first and second error-free regions in the volatile memory device by testing the volatile memory device using the memory controller via the host, the second error-free region being different from the first error-free region; generating an address map with respect to a defective cell region of the volatile memory device via the host, based on the testing; and executing program code of an operating system (OS) of the electronic device, the program code of the OS being stored in the non-volatile memory device, the executing including loading the OS to the volatile memory device based on the address map via the host.

主权项

1. A method of operation of an electronic device comprising a storage device in which a volatile memory device and a non-volatile memory device are embedded, the method comprising:
initializing a memory controller connected to the volatile memory device, via a host connected to the storage device; obtaining a first error-free region and a second error-free region in the volatile memory device by testing the volatile memory device using the memory controller via the host, the second error-free region being different from the first error-free region; generating an address map with respect to a defective cell region of the volatile memory device via the host, based on a result of the testing of the volatile memory device; and executing program code of an operating system (OS) of the electronic device, the program code of the OS being stored in the non-volatile memory device, the executing including loading the OS to the volatile memory device based on the address map via the host.