| 发明名称 |
PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN |
| 摘要 |
According to one embodiment, a particle inspection system includes a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip, a current-voltage conversion circuit which converts, into a voltage signal, a current signal output from the particle inspection chip when the driving voltage is applied to the particle inspection chip, a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip, and an analysis circuit which analyzes the fine particle, in the sample liquid based on the voltage signal. The voltage driving circuit varies the driving voltage based on the detection result of the detection circuit. |
| 申请公布号 |
US2017122859(A1) |
申请公布日期 |
2017.05.04 |
| 申请号 |
US201715408702 |
申请日期 |
2017.01.18 |
| 申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
NISHIGAKI Michihiko;HAMASAKI Hiroshi;NAKAMURA Naofumi;KOBAYASHI Kentaro;MIKI Hiroko |
| 分类号 |
G01N15/10;G01N15/12 |
主分类号 |
G01N15/10 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A particle inspection system comprising:
a voltage driving circuit which applies a driving voltage for a particle inspection to a particle inspection chip which detects a fine particle in a sample liquid and outputs a current signal indicative of the fine particle; a current-voltage conversion circuit which converts, into a voltage signal, the current signal output from the particle inspection (ship when the driving voltage is applied to the particle inspection chip; a detection circuit which detects, based on the voltage signal, whether the sample liquid is introduced into a detection region of the particle inspection chip; and an analysis circuit which analyzes the fine particle in the sample liquid based on the voltage signal, wherein the voltage driving circuit varies the driving voltage based on a detection result of the detection circuit. |
| 地址 |
Tokyo JP |
