发明名称 METHOD OF FORMING SEMICONDUCTOR DEVICE
摘要 A method of forming a semiconductor device is provided. At least two shallow trenches are formed in a substrate. An insulating layer is formed on surfaces of the substrate and the shallow trenches. A conductive layer is formed on the substrate between the shallow trenches. At least one spacer is formed on a sidewall of the conductive layer, wherein the spacer fills up each shallow trench.
申请公布号 US2017125547(A1) 申请公布日期 2017.05.04
申请号 US201715406355 申请日期 2017.01.13
申请人 United Microelectronics Corp. 发明人 Hsiao Shih-Yin;Yang Ching-Chung
分类号 H01L29/66;H01L21/311;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of forming a semiconductor device, comprising: forming at least two shallow trenches in a substrate; forming an insulating layer on surfaces of the substrate and the shallow trenches; forming a conductive layer on the substrate between the shallow trenches; and forming at least one spacer on a sidewall of the conductive layer, wherein the shallow trenches are completely filled with the at least one spacer.
地址 Hsinchu TW