发明名称 |
METHOD OF FORMING SEMICONDUCTOR DEVICE |
摘要 |
A method of forming a semiconductor device is provided. At least two shallow trenches are formed in a substrate. An insulating layer is formed on surfaces of the substrate and the shallow trenches. A conductive layer is formed on the substrate between the shallow trenches. At least one spacer is formed on a sidewall of the conductive layer, wherein the spacer fills up each shallow trench. |
申请公布号 |
US2017125547(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201715406355 |
申请日期 |
2017.01.13 |
申请人 |
United Microelectronics Corp. |
发明人 |
Hsiao Shih-Yin;Yang Ching-Chung |
分类号 |
H01L29/66;H01L21/311;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a semiconductor device, comprising:
forming at least two shallow trenches in a substrate; forming an insulating layer on surfaces of the substrate and the shallow trenches; forming a conductive layer on the substrate between the shallow trenches; and forming at least one spacer on a sidewall of the conductive layer, wherein the shallow trenches are completely filled with the at least one spacer. |
地址 |
Hsinchu TW |