发明名称 STRUCTURE AND METHOD TO REDUCE SHORTING IN STT-MRAM DEVICE
摘要 A method of making a magnetic random access memory (MRAM) device includes depositing a spacer material on an electrode; forming a magnetic tunnel junction (MTJ) on the spacer material that includes a reference layer in contact with the spacer material, a free layer, and a tunnel barrier layer; patterning a hard mask on the free layer; etching the MTJ and the spacer material to transfer a pattern of the hard mask into the MTJ and the spacer material; forming an insulating layer along a sidewall of the hard mask, the MTJ, and the spacer material; disposing an interlayer dielectric (ILD) on and around the hard mask, MTJ, and spacer material; etching through the ILD to form a trench that extends to a surface and sidewall of the hard mask and a sidewall of a portion of the MTJ; and disposing a metal in the trench to form a contact electrode.
申请公布号 US2017125667(A1) 申请公布日期 2017.05.04
申请号 US201615202821 申请日期 2016.07.06
申请人 International Business Machines Corporation 发明人 Annunziata Anthony J.;Lauer Gen P.;Marchack Nathan P.
分类号 H01L43/08;H01L43/10;G11C11/16;H01L43/12;H01L43/02 主分类号 H01L43/08
代理机构 代理人
主权项 1. A method of making a magnetic random access memory (MRAM) device, the method comprising: depositing a conductive spacer material on an electrode; forming a magnetic tunnel junction (MTJ) on the spacer material; patterning a hard mask on the MTJ; etching the MTJ and the conductive spacer material to transfer a pattern of the hard mask into the MTJ and the conductive spacer material; forming an insulating layer along a sidewall of the hard mask, the MTJ, and the conductive spacer material; and disposing an interlayer dielectric (ILD) on and around the hard mask, the MTJ, and the spacer material.
地址 Armonk NY US