发明名称 |
Method of Forming a Flexible Semiconductor Layer and Devices on a Flexible Carrier |
摘要 |
A method for fabricating a semiconductor device comprises providing a preformed spalled structure comprising a stressor layer stack on a first surface of a semiconductor substrate; forming an interfacial release layer on an exposed second surface of the semiconductor substrate; adhesively bonding the interfacial release layer to a rigid handle substrate using an epoxy; removing at least a portion of the stressor layer stack from the first surface of the semiconductor substrate; processing the semiconductor substrate; and removing the semiconductor substrate from the interfacial release layer to impart flexibility to the semiconductor substrate. |
申请公布号 |
US2017125277(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201715404362 |
申请日期 |
2017.01.12 |
申请人 |
International Business Machines Corporation |
发明人 |
Bedell Stephen W.;Sadana Devendra K.;Saenger Katherine L.;Salhi Abdelmajid |
分类号 |
H01L21/683;H01L21/78 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor device, comprising:
providing a structure comprising a stressor layer stack on a first surface of a semiconductor substrate; forming an interfacial release layer on an exposed second surface of the semiconductor substrate; adhesively bonding the interfacial release layer to a rigid handle substrate using an epoxy; removing at least a portion of the stressor layer stack from the first surface of the semiconductor substrate; processing the semiconductor substrate by isolating cells in the semiconductor substrate by applying a hardmask to the semiconductor substrate and etching exposed semiconductor substrate down to the epoxy; and removing the hardmask and applying a pressure-sensitive tape to the semiconductor substrate to remove the semiconductor substrate from the interfacial release layer; wherein processing the semiconductor substrate further comprises one or more of patterning the semiconductor substrate, thermally treating the semiconductor substrate, thinning the semiconductor substrate, and depositing a film on the semiconductor substrate. |
地址 |
Armonk NY US |