发明名称 Method of Forming a Flexible Semiconductor Layer and Devices on a Flexible Carrier
摘要 A method for fabricating a semiconductor device comprises providing a preformed spalled structure comprising a stressor layer stack on a first surface of a semiconductor substrate; forming an interfacial release layer on an exposed second surface of the semiconductor substrate; adhesively bonding the interfacial release layer to a rigid handle substrate using an epoxy; removing at least a portion of the stressor layer stack from the first surface of the semiconductor substrate; processing the semiconductor substrate; and removing the semiconductor substrate from the interfacial release layer to impart flexibility to the semiconductor substrate.
申请公布号 US2017125277(A1) 申请公布日期 2017.05.04
申请号 US201715404362 申请日期 2017.01.12
申请人 International Business Machines Corporation 发明人 Bedell Stephen W.;Sadana Devendra K.;Saenger Katherine L.;Salhi Abdelmajid
分类号 H01L21/683;H01L21/78 主分类号 H01L21/683
代理机构 代理人
主权项 1. A method for fabricating a semiconductor device, comprising: providing a structure comprising a stressor layer stack on a first surface of a semiconductor substrate; forming an interfacial release layer on an exposed second surface of the semiconductor substrate; adhesively bonding the interfacial release layer to a rigid handle substrate using an epoxy; removing at least a portion of the stressor layer stack from the first surface of the semiconductor substrate; processing the semiconductor substrate by isolating cells in the semiconductor substrate by applying a hardmask to the semiconductor substrate and etching exposed semiconductor substrate down to the epoxy; and removing the hardmask and applying a pressure-sensitive tape to the semiconductor substrate to remove the semiconductor substrate from the interfacial release layer; wherein processing the semiconductor substrate further comprises one or more of patterning the semiconductor substrate, thermally treating the semiconductor substrate, thinning the semiconductor substrate, and depositing a film on the semiconductor substrate.
地址 Armonk NY US