发明名称 |
Reference-less Frequency Detector With High Jitter Tolerance |
摘要 |
An apparatus, comprising a first sampling circuit configured to sample a clock signal according to a data signal to produce a first sampled signal, a second sampling circuit configured to sample the clock signal according to a delay signal to produce a second sampled signal, and a control circuit coupled to the first sampling circuit and the second sampling circuit, wherein the control circuit is configured to perform a not-and (NAND) operation according to the first sampled signal and the second sampled signal to produce an activation signal for activating a frequency adjustment for the clock signal. |
申请公布号 |
US2017126236(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201615394364 |
申请日期 |
2016.12.29 |
申请人 |
Futurewei Technologies, Inc. |
发明人 |
Gu Liang;Cao Yuming;Lei Gong;Dang Yen;Gu Yifan;Lee Hungyi;Deshpande Mamatha;Shih Shou-Po;Duan Yan |
分类号 |
H03L7/099;H03L7/08;H03K5/135;H03K5/14;H03K19/20;H03K19/0948 |
主分类号 |
H03L7/099 |
代理机构 |
|
代理人 |
|
主权项 |
1. An apparatus comprising:
a not-and (NAND) gate comprising a first NAND gate input port, a second NAND gate input port, and a NAND gate output port; and a voltage-to-current (V2I) converter comprising a V2I converter activation port and a V2I converter output current port, wherein the V2I converter activation port is coupled to the NAND gate output port, and wherein the V2I converter output current port is configured to couple to a frequency detection loop filter. |
地址 |
Plano TX US |