发明名称 INTEGRATED CIRCUIT STRUCTURE AND METHOD OF FORMING THE SAME
摘要 An integrated circuit structure with a back side through silicon via (B/S TSV) therein and a method of forming the same is disclosed. The method includes the steps of: receiving a wafer comprising a substrate having a front side that has a conductor thereon and a back side; forming a back side through silicon via (B/S TSV) from the back side of the substrate to penetrate the substrate; and filling the back side through silicon via (B/S TSV) with a conductive material to form an electrical connection with the conductor. Thus a back side through silicon via penetrates the back side of the substrate and electrically connects to the conductor on the front side of the substrate is formed.
申请公布号 US2017125341(A1) 申请公布日期 2017.05.04
申请号 US201514929040 申请日期 2015.10.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN Jeng-Shyan;YAUNG Dun-Nian;LIN Hsing-Chih;LIU Jen-Cheng;KAO Min-Feng;HUANG Hsun-Ying
分类号 H01L23/522;H01L21/768;H01L23/528 主分类号 H01L23/522
代理机构 代理人
主权项 1. A method of forming an integrated circuit structure, the method comprising: receiving a substrate having a front side that comprises a conductor thereon and a back side; thinning down the substrate from the back side of the substrate; forming a first photo resist mask to etch a first via hole from the back side of the substrate without exposing the conductor; forming a side wall film on a side wall of the first via hole without covering a bottom of the first via hole; forming a second photo resist mask to etch through the bottom of the first via hole to form a second via hole, which has a size smaller than a size of the first via hole, to expose the conductor; and filling the first and second via holes with a conductive material to be electrically connected to the conductor.
地址 HSINCHU TW