发明名称 |
BACK-ILLUMINATED TYPE SOLID-STATE IMAGING DEVICE |
摘要 |
A back-illuminated type solid-state imaging device is provided in which an electric field to collect a signal charge (an electron, a hole and the like, for example) is reliably generated to reduce a crosstalk.;The back-illuminated type solid-state imaging device includes a structure 34 having a semiconductor film 33 on a semiconductor substrate 31 through an insulation film 32, in which a photoelectric conversion element PD that constitutes a pixel is formed in the semiconductor substrate 31, at least part of transistors 15, 16, and 19 that constitute the pixel is formed in the semiconductor film 33, and a rear surface electrode 51 to which a voltage is applied is formed on the rear surface side of the semiconductor substrate 31. |
申请公布号 |
US2017125463(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201715402381 |
申请日期 |
2017.01.10 |
申请人 |
SONY CORPORATION |
发明人 |
Mabuchi Keiji |
分类号 |
H01L27/146;H01L31/18 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A back-illuminated type solid-state imaging device comprising:
a semiconductor layer on a front surface side of a semiconductor substrate with an insulation film between them; a photoelectric conversion element that constitutes a pixel in said semiconductor substrate, the photoelectric conversion element including a charge accumulation portion, the charge accumulation portion includes a plurality of impurity regions and a high impurity region formed directly between the plurality of impurity regions; at least part of transistors that constitute said pixel are included in said semiconductor film; and a rear surface electrode on the rear surface side of said semiconductor substrate to which a negative voltage is applied, the rear surface electrode being transparent, wherein, a semiconductor layer of an opposite conduction type to the charge accumulation portion of said photoelectric conversion element is formed in a portion of the semiconductor substrate under said insulation film, and a semiconductor layer of an opposite conduction type to a charge accumulation portion of said photoelectric conversion element is formed in the semiconductor substrate under said insulation film. |
地址 |
TOKYO JP |