发明名称 BACK-ILLUMINATED TYPE SOLID-STATE IMAGING DEVICE
摘要 A back-illuminated type solid-state imaging device is provided in which an electric field to collect a signal charge (an electron, a hole and the like, for example) is reliably generated to reduce a crosstalk.;The back-illuminated type solid-state imaging device includes a structure 34 having a semiconductor film 33 on a semiconductor substrate 31 through an insulation film 32, in which a photoelectric conversion element PD that constitutes a pixel is formed in the semiconductor substrate 31, at least part of transistors 15, 16, and 19 that constitute the pixel is formed in the semiconductor film 33, and a rear surface electrode 51 to which a voltage is applied is formed on the rear surface side of the semiconductor substrate 31.
申请公布号 US2017125463(A1) 申请公布日期 2017.05.04
申请号 US201715402381 申请日期 2017.01.10
申请人 SONY CORPORATION 发明人 Mabuchi Keiji
分类号 H01L27/146;H01L31/18 主分类号 H01L27/146
代理机构 代理人
主权项 1. A back-illuminated type solid-state imaging device comprising: a semiconductor layer on a front surface side of a semiconductor substrate with an insulation film between them; a photoelectric conversion element that constitutes a pixel in said semiconductor substrate, the photoelectric conversion element including a charge accumulation portion, the charge accumulation portion includes a plurality of impurity regions and a high impurity region formed directly between the plurality of impurity regions; at least part of transistors that constitute said pixel are included in said semiconductor film; and a rear surface electrode on the rear surface side of said semiconductor substrate to which a negative voltage is applied, the rear surface electrode being transparent, wherein, a semiconductor layer of an opposite conduction type to the charge accumulation portion of said photoelectric conversion element is formed in a portion of the semiconductor substrate under said insulation film, and a semiconductor layer of an opposite conduction type to a charge accumulation portion of said photoelectric conversion element is formed in the semiconductor substrate under said insulation film.
地址 TOKYO JP