APPARATUS AND METHODS FOR DYNAMIC PASSIVE INTERMODULATION DISTORTION TESTING

摘要

A passive intermodulation (“PIM”) distortion test apparatus includes a housing, hammering elements disposed within the housing, each hammering element including a moveable striking member, a strike plate positioned above the hammering elements, where a bottom surface of the strike plate is positioned at a distance above the hammering elements such that the moveable striking members of the hammering elements impact the strike plate when moved into their activated positions, and a retaining member that is configured to hold a device under test on a top surface of the strike plate while a PIM distortion test is performed on the device under test.

主权项

1. A passive intermodulation (“PIM”) distortion test apparatus, comprising:
a housing; a plurality of hammering elements disposed within the housing, each hammering element including a moveable striking member that is configured to move between a resting position and an activated position; a strike plate positioned above the hammering elements, wherein a bottom surface of the strike plate is positioned at a distance above the hammering elements such that the moveable striking members of the hammering elements impact the strike plate when moved into their activated positions; and a retaining member that is configured to hold a device under test on a top surface of the strike plate while a PIM distortion test is performed on the device under test.