发明名称 METHOD OF MANUFACTURING PHOTOMASK BLANK AND PHOTOMASK BLANK
摘要 In a chamber (50), a quartz substrate (10) having a main surface on which an optical film (20) is formed is put on a susceptor (30). A flash lamp (60) is housed in a lamp house (90), and the optical film (20) is irradiated with flash light through two quartz plates (70a and 70b). A transmittance adjustment region (80) is formed on a surface of the quartz plate (70b) of the two quartz plates (70a and 70b), and the amount of light with which the optical film (20) is irradiated has in-plane distribution. If the optical film (20) is irradiated with the flash light, optical characteristics of the optical film (20) change depending on the received irradiation energy. Hence, for example, the characteristics of the optical film are not uniform, the optical film is irradiated with flash light having such irradiation energy distribution that cancels the in-plane distribution.
申请公布号 US2017123306(A1) 申请公布日期 2017.05.04
申请号 US201715404755 申请日期 2017.01.12
申请人 Shin-Etsu Chemical Co., Ltd. 发明人 FUKAYA Souichi;INAZUKI Yukio
分类号 G03F1/32 主分类号 G03F1/32
代理机构 代理人
主权项 1. A method of manufacturing a photomask blank, comprising: forming an optical film on a quartz substrate transparent to exposure light; and irradiating said optical film with flash lamp light, wherein said optical film is irradiated with the flash lamp light through a quartz plate on which a region with a different transmittance to the flash lamp light is formed, and wherein the flash light irradiation energy is set to a predetermined amount of 41.5 J/cm2 or less.
地址 Chiyoda-ku JP