发明名称 |
Smart Testing Management |
摘要 |
The invention is related to a smart testing apparatus and preferably a method for testing at least a first DUT and a second DUT using a mobile communications testing device. The method comprises the steps of determining, whether a first RF test signal from/to the first DUT interferes with a second RF test signal from/to the second DUT. It determines, whether the second RF test signal from/to second DUT interferes with the first RF test signal from/to the first DUT. It predetermines, whether at least measuring the first measuring result obtained by applying the first RF test signal is disturbed above a first disturbance threshold value. It predetermines, whether at least a second measuring result obtained by applying the second RF test signal is disturbed above a second disturbance threshold value. |
申请公布号 |
US2017126336(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201615159936 |
申请日期 |
2016.05.20 |
申请人 |
Rohde & Schwarz GmbH & Co. KG |
发明人 |
STROHMEIER Anton;BLOCK Michael;PLAUMANN Ralf;LUTZ Thomas;OBERMAYR Franz;KLAUS Christiane;VOLKMANN Jens |
分类号 |
H04B17/15;H04B17/345 |
主分类号 |
H04B17/15 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for testing at least a first device under test (DUT) and a second device under test (DUT), comprising:
determining whether a first radio frequency (RF) test signal from/to the first DUT interferes with a second radio frequency (RF) test signal from/to the second DUT; determining whether the second RF test signal from/to the second DUT interferes with the first RF test signal from/to the first DUT; determining whether at least a first measuring result obtained by applying the first RF test signal is disturbed above a first disturbance threshold value; determining whether at least a second measuring result obtained by applying the second RF test signal is disturbed above a second disturbance threshold value; and allocating resources in a fixed order of resource allocation to avoid deadlocks, whereby a resource allocation is first provided to a signal generator and subsequently provided to a measuring device. |
地址 |
Munich DE |