发明名称 Apparatus for measuring the thickness of thin layers
摘要 A deflecting mirror is in the optical path between a monocular microscope for viewing the region of a layer on which an X-ray beam falls, and the region of a layer, the thickness of which is measured according to the X-ray fluroescence principle. The mirror is in an apparatus that has an X-ray beam generator which emits an X-ray beam along a longitudinal geometrical axis, a table device arranged to support the layer, a diaphragm device of a material which absorbs X-rays, having an aperture which is in the longitudinal geometrical axis, and a light source which can be directed onto the region for the layer. The mirror is composed of glass and has a hole at 45 DEG to the plane of the mirror. The longitudinal geometrical axis of the X-ray beam passes through the hole.
申请公布号 US4799246(A) 申请公布日期 1989.01.17
申请号 US19860858689 申请日期 1986.05.02
申请人 FISCHER, HELMUT 发明人 FISCHER, HELMUT
分类号 G01B15/02;G01N23/06;G01N23/223;(IPC1-7):G01B15/02 主分类号 G01B15/02
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