发明名称 |
Testing method and apparatus for electronic components |
摘要 |
A method and apparatus for testing and/or burning-in electronic devices such as capacitors is disclosed. The devices are loaded in a matrix having a multiplicity of apertures. A second matrix having complemental apertures is provided, the apertures of the second matrix being filled with fuses. The matrices are pressed together by yieldable electrodes which are connected with a source of current.
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申请公布号 |
US4633175(A) |
申请公布日期 |
1986.12.30 |
申请号 |
US19840674519 |
申请日期 |
1984.11.23 |
申请人 |
AVX CORPORATION |
发明人 |
RITCHIE, KIM;HOPKINS, LONNIE;GALVAGNI, JOHN |
分类号 |
G01R31/01;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/01 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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