Test fixture including deflectable probes

摘要

A test fixture including deflectable test probes employing flexible members attaching a probe head to a probe shaft, the probe head engaging a locating aperture to deflect the probe head to a printed wiring board test point not in alignment with the test probe axis. The test probe head may be of conical shape and include a plurality of ribs spaced along an outer surface thereof to reduce friction. The probe head may include a tip which is rounded to reduce test point damage or optionally pointed to achieve fine test point contacting resolution.